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    Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe

    New search for: Johann, L.
    New search for: En Naciri, A.
    New search for: Broch, L.
    New search for: Demange, V.
    New search for: Ghambaja, J.
    New search for: Machizaud, F.
    New search for: Dubois, J. M.

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    Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe

    New search for: Johann, L.
    New search for: En Naciri, A.
    New search for: Broch, L.
    New search for: Demange, V.
    New search for: Ghambaja, J.
    New search for: Machizaud, F.
    New search for: Dubois, J. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe

    New search for: Johann, L.
    New search for: En Naciri, A.
    New search for: Broch, L.
    New search for: Demange, V.
    New search for: Ghambaja, J.
    New search for: Machizaud, F.
    New search for: Dubois, J. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe

    Contributors:

    Johann, L. (author) / En Naciri, A. (author) / Broch, L. (author) / Demange, V. (author) / Ghambaja, J. (author) / Machizaud, F. (author) / Dubois, J. M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 207 ; 300-305

    Publication date:

    2003-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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