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Study of the effect of crack closure in Sonic Infrared Imaging

Lu, J. / Han, X. / Newaz, G. / Favro, L. D. / Thomas, R. L.

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Study of the effect of crack closure in Sonic Infrared Imaging

Lu, J. / Han, X. / Newaz, G. / Favro, L. D. / Thomas, R. L.

Study of the effect of crack closure in Sonic Infrared Imaging

Lu, J. / Han, X. / Newaz, G. / Favro, L. D. / Thomas, R. L.

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Check availability in my library

Order at Subito €

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Document information

Title:

Study of the effect of crack closure in Sonic Infrared Imaging

Contributors:

Lu, J. (author) / Han, X. (author) / Newaz, G. (author) / Favro, L. D. (author) / Thomas, R. L. (author)

Published in:

NONDESTRUCTIVE TESTING AND EVALUATION ; 22 ; 127-135

Publication date:

2007-01-01

Size:

9 pages

ISSN:

1058-9759

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1127

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