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Optimizing the sensitivity of the small-disc creep test to damage and test conditions

Evans, M. / Wang, D.

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Optimizing the sensitivity of the small-disc creep test to damage and test conditions

Evans, M. / Wang, D.

Optimizing the sensitivity of the small-disc creep test to damage and test conditions

Evans, M. / Wang, D.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Optimizing the sensitivity of the small-disc creep test to damage and test conditions

Contributors:

Evans, M. (author) / Wang, D. (author)

Published in:

JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN ; 42 ; 389-414

Publication date:

2007-01-01

Size:

26 pages

ISSN:

0309-3247

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 624.176

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