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Dielectric properties characterization of La- and Dy-doped BiFeO~3 thin films

Petrov, P. K. / Palkar, V. R. / Tagantsev, A. K. / Chien, H.-I. / Prashanthi, K. / Axelsson, A.-K. / Bhattacharya, S. / Alford, N. M. N.

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Dielectric properties characterization of La- and Dy-doped BiFeO~3 thin films

Petrov, P. K. / Palkar, V. R. / Tagantsev, A. K. / Chien, H.-I. / Prashanthi, K. / Axelsson, A.-K. / Bhattacharya, S. / Alford, N. M. N.

Dielectric properties characterization of La- and Dy-doped BiFeO~3 thin films

Petrov, P. K. / Palkar, V. R. / Tagantsev, A. K. / Chien, H.-I. / Prashanthi, K. / Axelsson, A.-K. / Bhattacharya, S. / Alford, N. M. N.

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Document information

Title:

Dielectric properties characterization of La- and Dy-doped BiFeO~3 thin films

Contributors:

Petrov, P. K. (author) / Palkar, V. R. (author) / Tagantsev, A. K. (author) / Chien, H.-I. (author) / Prashanthi, K. (author) / Axelsson, A.-K. (author) / Bhattacharya, S. (author) / Alford, N. M. N. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 22 ; 2179-2184

Publication date:

2007-01-01

Size:

6 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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