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Lifetime tests of structures with the use of microprocessor strain-gaging systems
Lifetime tests of structures with the use of microprocessor strain-gaging systems
Lifetime tests of structures with the use of microprocessor strain-gaging systems
Stepanova, L. N. (author) / Kozhemyakin, V. L. (author)
2007-01-01
5 pages
Article (Journal)
English
DDC:
620.1127
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Lifetime tests of structures with the use of microprocessor strain-gaging systems
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