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Lifetime tests of structures with the use of microprocessor strain-gaging systems
Lifetime tests of structures with the use of microprocessor strain-gaging systems
Lifetime tests of structures with the use of microprocessor strain-gaging systems
Stepanova, L. N. (Autor:in) / Kozhemyakin, V. L. (Autor:in)
01.01.2007
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1127
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