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    Thermal Behavior of Electron Irradiation Defects in CZ-Si

    New search for: Cui, H.Y.
    New search for: Li, Y.X.
    New search for: Chen, G.F.
    New search for: Cai, L.L.
    New search for: Zhao, E.
    New search for: Chang, Y.W.
    New search for: Kim, N.J.
    New search for: Lee, C.S.

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    Thermal Behavior of Electron Irradiation Defects in CZ-Si

    New search for: Cui, H.Y.
    New search for: Li, Y.X.
    New search for: Chen, G.F.
    New search for: Cai, L.L.
    New search for: Zhao, E.
    New search for: Chang, Y.W.
    New search for: Kim, N.J.
    New search for: Lee, C.S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thermal Behavior of Electron Irradiation Defects in CZ-Si

    New search for: Cui, H.Y.
    New search for: Li, Y.X.
    New search for: Chen, G.F.
    New search for: Cai, L.L.
    New search for: Zhao, E.
    New search for: Chang, Y.W.
    New search for: Kim, N.J.
    New search for: Lee, C.S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Thermal Behavior of Electron Irradiation Defects in CZ-Si

    Contributors:

    Cui, H.Y. (author) / Li, Y.X. (author) / Chen, G.F. (author) / Cai, L.L. (author) / Zhao, E. (author) / Chang, Y.W. / Kim, N.J. / Lee, C.S.

    Published in:

    PRICM 6: Selected, peer reviewed papers from The Sixth Pacific Rim International Conference on Advanced Materials and Processing, November 5-9, 2007, ICC Jeju, Jeju Island, Korea ; 1113-1116

    MATERIALS SCIENCE FORUM ; 561/565

    Publication date:

    2007-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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