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    Defects Introduced by Electron-Irradiation at Low Temperatures in SiC

    New search for: Son, N.T.
    New search for: Isoya, J.
    New search for: Morishita, N.
    New search for: Ohshima, T.
    New search for: Itoh, H.
    New search for: Gali, A.
    New search for: Janzen, E.

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    Defects Introduced by Electron-Irradiation at Low Temperatures in SiC

    New search for: Son, N.T.
    New search for: Isoya, J.
    New search for: Morishita, N.
    New search for: Ohshima, T.
    New search for: Itoh, H.
    New search for: Gali, A.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defects Introduced by Electron-Irradiation at Low Temperatures in SiC

    New search for: Son, N.T.
    New search for: Isoya, J.
    New search for: Morishita, N.
    New search for: Ohshima, T.
    New search for: Itoh, H.
    New search for: Gali, A.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Defects Introduced by Electron-Irradiation at Low Temperatures in SiC

    Contributors:

    Son, N.T. (author) / Isoya, J. (author) / Morishita, N. (author) / Ohshima, T. (author) / Itoh, H. (author) / Gali, A. (author) / Janzen, E. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 615/617 ; 377-380

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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