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Ferroelectric properties of bilayer structured Pb(Zr0.52Ti0.48)O3/SrBi2Ta2O9 (PZT/SBT) thin films on Pt/TiO2/SiO2/Si substrates
Ferroelectric properties of bilayer structured Pb(Zr0.52Ti0.48)O3/SrBi2Ta2O9 (PZT/SBT) thin films on Pt/TiO2/SiO2/Si substrates
Ferroelectric properties of bilayer structured Pb(Zr0.52Ti0.48)O3/SrBi2Ta2O9 (PZT/SBT) thin films on Pt/TiO2/SiO2/Si substrates
Zhang, W. Q. (author) / Li, A. D. (author) / Shao, Q. Y. (author) / Xia, Y. D. (author) / Wu, D. (author) / Liu, Z. G. (author) / Ming, N. B. (author)
APPLIED SURFACE SCIENCE ; 254 ; 1583-1586
2008-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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