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Stress-Driven Surface Topography Evolution in Nanocrystalline Al Thin Films

Gianola, D. S. / Eberl, C. / Cheng, X. M. / Hemker, K. J.

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Stress-Driven Surface Topography Evolution in Nanocrystalline Al Thin Films

Gianola, D. S. / Eberl, C. / Cheng, X. M. / Hemker, K. J.

Stress-Driven Surface Topography Evolution in Nanocrystalline Al Thin Films

Gianola, D. S. / Eberl, C. / Cheng, X. M. / Hemker, K. J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Stress-Driven Surface Topography Evolution in Nanocrystalline Al Thin Films

Contributors:

Gianola, D. S. (author) / Eberl, C. (author) / Cheng, X. M. (author) / Hemker, K. J. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 20 ; 303-308

Publication date:

2008-01-01

Size:

6 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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