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Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry
Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry
Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry
Chang, S.P. (author) / Xie, T.B. (author) / Wang, X.Z. (author) / Guo, J. (author) / Jin, G.F. / Lee, W.B. / Cheung, C.F. / To, S.
2008-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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