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Automatic Optical Inspection on TFT-LCD Mura Defects Using Background Image Reconstruction

Chen, L.C. / Kuo, C.C. / Yen, P.A.

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Automatic Optical Inspection on TFT-LCD Mura Defects Using Background Image Reconstruction

Chen, L.C. / Kuo, C.C. / Yen, P.A.

Automatic Optical Inspection on TFT-LCD Mura Defects Using Background Image Reconstruction

Chen, L.C. / Kuo, C.C. / Yen, P.A.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Automatic Optical Inspection on TFT-LCD Mura Defects Using Background Image Reconstruction

Contributors:

Chen, L.C. (author) / Kuo, C.C. (author) / Yen, P.A. (author) / Jin, G.F. / Lee, W.B. / Cheung, C.F. / To, S.

Published in:

Advances in Optics Design and Precision Manufacturing Technologies ; 400-403

KEY ENGINEERING MATERIALS ; 364/366

Publication date:

2008-01-01

Size:

4 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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