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    Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films

    New search for: Quinn, D.J.
    New search for: Wardle, B.
    New search for: Spearing, S.M.

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    Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films

    New search for: Quinn, D.J.
    New search for: Wardle, B.
    New search for: Spearing, S.M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films

    New search for: Quinn, D.J.
    New search for: Wardle, B.
    New search for: Spearing, S.M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films

    Contributors:

    Quinn, D.J. (author) / Wardle, B. (author) / Spearing, S.M. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 609-618

    Publication date:

    2008-01-01

    Size:

    10 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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