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    Disappearance of stress singularity at interface edge due to nanostructured thin film

    New search for: Sumigawa, T.
    New search for: Hirakata, H.
    New search for: Takemura, M.
    New search for: Matsumoto, S.
    New search for: Suzuki, M.
    New search for: Kitamura, T.

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    Disappearance of stress singularity at interface edge due to nanostructured thin film

    New search for: Sumigawa, T.
    New search for: Hirakata, H.
    New search for: Takemura, M.
    New search for: Matsumoto, S.
    New search for: Suzuki, M.
    New search for: Kitamura, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Disappearance of stress singularity at interface edge due to nanostructured thin film

    New search for: Sumigawa, T.
    New search for: Hirakata, H.
    New search for: Takemura, M.
    New search for: Matsumoto, S.
    New search for: Suzuki, M.
    New search for: Kitamura, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Disappearance of stress singularity at interface edge due to nanostructured thin film

    Contributors:

    Sumigawa, T. (author) / Hirakata, H. (author) / Takemura, M. (author) / Matsumoto, S. (author) / Suzuki, M. (author) / Kitamura, T. (author)

    Published in:

    ENGINEERING FRACTURE MECHANICS ; 75 ; 3073-3083

    Publication date:

    2008-01-01

    Size:

    11 pages

    ISSN:

    0013-7944

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1 / 126

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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