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Investigation of pearlite structure by means of electron backscatter diffraction and image analysis of SEM micrographs with an application of the Hough transform
Investigation of pearlite structure by means of electron backscatter diffraction and image analysis of SEM micrographs with an application of the Hough transform
Investigation of pearlite structure by means of electron backscatter diffraction and image analysis of SEM micrographs with an application of the Hough transform
Walentek, A. (author) / Seefeldt, M. (author) / Verlinden, B. (author) / Aernoudt, E. (author) / Van Houtte, P. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 483/484 ; 716-718
2008-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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