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Electron backscatter diffraction analysis of ZnO:Al thin films

Garcia, C. B. / Ariza, E. / Tavares, C. J. / Villechaise, P.

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Electron backscatter diffraction analysis of ZnO:Al thin films

Garcia, C. B. / Ariza, E. / Tavares, C. J. / Villechaise, P.

Electron backscatter diffraction analysis of ZnO:Al thin films

Garcia, C. B. / Ariza, E. / Tavares, C. J. / Villechaise, P.

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Check availability in my library

Order at Subito €

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Document information

Title:

Electron backscatter diffraction analysis of ZnO:Al thin films

Contributors:

Garcia, C. B. (author) / Ariza, E. (author) / Tavares, C. J. (author) / Villechaise, P. (author)

Published in:

APPLIED SURFACE SCIENCE ; 259 ; 590-595

Publication date:

2012-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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