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Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputtering
Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputtering
Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputtering
Wasielewski, R. (author) / Domaradzki, J. (author) / Wojcieszak, D. (author) / Kaczmarek, D. (author) / Borkowska, A. (author) / Prociow, E. L. (author) / Ciszewski, A. (author)
APPLIED SURFACE SCIENCE ; 254 ; 4396-4400
2008-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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