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Traps identification in silicon nanocrystals memories by low noise technique

Sghaier, N. / Troudi, M. / Militaru, L. / Kalboussi, A. / Souifi, A.

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Traps identification in silicon nanocrystals memories by low noise technique

Sghaier, N. / Troudi, M. / Militaru, L. / Kalboussi, A. / Souifi, A.

Traps identification in silicon nanocrystals memories by low noise technique

Sghaier, N. / Troudi, M. / Militaru, L. / Kalboussi, A. / Souifi, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Traps identification in silicon nanocrystals memories by low noise technique

Contributors:

Sghaier, N. (author) / Troudi, M. (author) / Militaru, L. (author) / Kalboussi, A. (author) / Souifi, A. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -AMSTERDAM THEN LAUSANNE- C ; 28 ; 882-886

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0928-4931

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1 / 660

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