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    A spectroscopic ellipsometric investigation of new critical points of Zn1-xMnxS epilayers

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    New search for: Lee, J. W.
    New search for: Yu, Y. M.
    New search for: Choi, Y. D.

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    A spectroscopic ellipsometric investigation of new critical points of Zn1-xMnxS epilayers

    New search for: Kim, D. J.
    New search for: Lee, J. W.
    New search for: Yu, Y. M.
    New search for: Choi, Y. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A spectroscopic ellipsometric investigation of new critical points of Zn1-xMnxS epilayers

    New search for: Kim, D. J.
    New search for: Lee, J. W.
    New search for: Yu, Y. M.
    New search for: Choi, Y. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    A spectroscopic ellipsometric investigation of new critical points of Zn1-xMnxS epilayers

    Contributors:

    Kim, D. J. (author) / Lee, J. W. (author) / Yu, Y. M. (author) / Choi, Y. D. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 254 ; 5034-5038

    Publication date:

    2008-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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