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    Investigation of crystal structure and new ellipsometric properties of hexagonal CdS epilayers

    New search for: Kim, D. J.
    New search for: Choi, Y. D.
    New search for: Lee, J. W.
    New search for: Sur, J. C.

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    Investigation of crystal structure and new ellipsometric properties of hexagonal CdS epilayers

    New search for: Kim, D. J.
    New search for: Choi, Y. D.
    New search for: Lee, J. W.
    New search for: Sur, J. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of crystal structure and new ellipsometric properties of hexagonal CdS epilayers

    New search for: Kim, D. J.
    New search for: Choi, Y. D.
    New search for: Lee, J. W.
    New search for: Sur, J. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation of crystal structure and new ellipsometric properties of hexagonal CdS epilayers

    Contributors:

    Kim, D. J. (author) / Choi, Y. D. (author) / Lee, J. W. (author) / Sur, J. C. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 10402-10407

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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