Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy: Fid-Bau Portal

Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

Waddell, E. A. / Shreeves, S. / Carrell, H. / Perry, C. / Reid, B. A. / McKee, J.

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Waddell, E. A. / Shreeves, S. / Carrell, H. / Perry, C. / Reid, B. A. / McKee, J.

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Document information

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Document information

Title:

Contributors:

Waddell, E. A. (author) / Shreeves, S. (author) / Carrell, H. (author) / Perry, C. (author) / Reid, B. A. (author) / McKee, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 254 ; 5314-5318

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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