Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

Waddell, E. A. / Shreeves, S. / Carrell, H. et al. | British Library Online Contents | 2008

Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

Zhang, D. / Wang, Y. / Gan, Y. | British Library Online Contents | 2013

Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

Komolov, A. / Schaumburg, K. / Moller, P.J. et al. | British Library Online Contents | 1999

A comparative study of surface energy data from atomic force microscopy and from contact angle goniometry

Lamprou, D. A. / Smith, J. R. / Nevell, T. G. et al. | British Library Online Contents | 2010

Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen

Yuqing, X. / Liming, L. / Weigang, L. et al. | British Library Online Contents | 2001