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Damage Evaluation Based on Electrical Resistance Measurement

Yang, L.J. / Sun, B.X. / Guo, Y.M.

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Damage Evaluation Based on Electrical Resistance Measurement

Yang, L.J. / Sun, B.X. / Guo, Y.M.

Damage Evaluation Based on Electrical Resistance Measurement

Yang, L.J. / Sun, B.X. / Guo, Y.M.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Damage Evaluation Based on Electrical Resistance Measurement

Contributors:

Yang, L.J. (author) / Sun, B.X. (author) / Guo, Y.M. (author)

Published in:

KEY ENGINEERING MATERIALS ; 385/387 ; 589-592

Publication date:

2008-01-01

Size:

4 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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