Shave-off depth profiling: Depth profiling with an absolute depth scale

Nojima, M. / Maekawa, A. / Yamamoto, T. et al. | British Library Online Contents | 2006

The dose dependence of Si sputtering with low energy ions in shallow depth profiling

Moon, D. W. / Lee, H. I. | British Library Online Contents | 2003

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Harton, S. E. / Stevie, F. A. / Griffis, D. P. et al. | British Library Online Contents | 2006

Molecular depth profiling of organic and biological materials

Fletcher, J. S. / Conlan, X. A. / Lockyer, N. P. et al. | British Library Online Contents | 2006

Sputter Depth Profiling

King, B. V. | Springer Verlag | 1992