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Characterization of ionic migration on CoF substrate by ToF-SIMS
Characterization of ionic migration on CoF substrate by ToF-SIMS
Characterization of ionic migration on CoF substrate by ToF-SIMS
Mogi, S. (author) / Wada, M. (author) / Matsumura, Y. (author) / Tabira, Y. (author)
APPLIED SURFACE SCIENCE ; 255 ; 1443-1445
2008-01-01
3 pages
Article (Journal)
English
DDC:
621.35
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