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Structural characterization of b-V2O5 films prepared by DC reactive magnetron sputtering

Su, Q. / Lan, W. / Wang, Y. Y. / Liu, X. Q.

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Structural characterization of b-V2O5 films prepared by DC reactive magnetron sputtering

Su, Q. / Lan, W. / Wang, Y. Y. / Liu, X. Q.

Structural characterization of b-V2O5 films prepared by DC reactive magnetron sputtering

Su, Q. / Lan, W. / Wang, Y. Y. / Liu, X. Q.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Structural characterization of b-V2O5 films prepared by DC reactive magnetron sputtering

Contributors:

Su, Q. (author) / Lan, W. (author) / Wang, Y. Y. (author) / Liu, X. Q. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 4177-4179

Publication date:

2009-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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