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Bismuth redistribution induced by intermetallic compound growth in SnBi/Cu microelectronic interconnect

Liu, C. Z. / Zhang, W.

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Bismuth redistribution induced by intermetallic compound growth in SnBi/Cu microelectronic interconnect

Liu, C. Z. / Zhang, W.

Bismuth redistribution induced by intermetallic compound growth in SnBi/Cu microelectronic interconnect

Liu, C. Z. / Zhang, W.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Bismuth redistribution induced by intermetallic compound growth in SnBi/Cu microelectronic interconnect

Contributors:

Liu, C. Z. (author) / Zhang, W. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 44 ; 149-153

Publication date:

2009-01-01

Size:

5 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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