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Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
Cochrane, C.J. (author) / Lenahan, P.M. (author) / Lelis, A.J. (author)
MATERIALS SCIENCE FORUM ; 600/603 ; 719-722
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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