Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
Electrically Detected Magnetic Resonance Studies of Processing Variations in 4H SiC Based MOSFETs
Cochrane, C.J. (Autor:in) / Lenahan, P.M. (Autor:in) / Lelis, A.J. (Autor:in)
MATERIALS SCIENCE FORUM ; 600/603 ; 719-722
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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