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    Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope

    New search for: Pezzotti, G.
    New search for: Matsutani, A.
    New search for: Munisso, M.C.
    New search for: Zhu, W.L.
    New search for: Xiao, P.
    New search for: Ralph, B.

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    Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope

    New search for: Pezzotti, G.
    New search for: Matsutani, A.
    New search for: Munisso, M.C.
    New search for: Zhu, W.L.
    New search for: Xiao, P.
    New search for: Ralph, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope

    New search for: Pezzotti, G.
    New search for: Matsutani, A.
    New search for: Munisso, M.C.
    New search for: Zhu, W.L.
    New search for: Xiao, P.
    New search for: Ralph, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope

    Contributors:

    Pezzotti, G. (author) / Matsutani, A. (author) / Munisso, M.C. (author) / Zhu, W.L. (author) / Xiao, P. / Ralph, B.

    Published in:

    Advances in Ceramic Materials ; 93-102

    MATERIALS SCIENCE FORUM ; 606

    Publication date:

    2009-01-01

    Size:

    10 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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