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    Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

    New search for: Portavoce, A.
    New search for: Rodriguez, N.
    New search for: Daineche, R.
    New search for: Grosjean, C.
    New search for: Girardeaux, C.

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    Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

    New search for: Portavoce, A.
    New search for: Rodriguez, N.
    New search for: Daineche, R.
    New search for: Grosjean, C.
    New search for: Girardeaux, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

    New search for: Portavoce, A.
    New search for: Rodriguez, N.
    New search for: Daineche, R.
    New search for: Grosjean, C.
    New search for: Girardeaux, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

    Contributors:

    Portavoce, A. (author) / Rodriguez, N. (author) / Daineche, R. (author) / Grosjean, C. (author) / Girardeaux, C. (author)

    Published in:

    MATERIALS LETTERS ; 63 ; 676-678

    Publication date:

    2009-01-01

    Size:

    3 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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