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    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    New search for: Hayashi, H.
    New search for: Satake, T.
    New search for: Kaneko, K.
    New search for: Nagai, K.

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    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    New search for: Hayashi, H.
    New search for: Satake, T.
    New search for: Kaneko, K.
    New search for: Nagai, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    New search for: Hayashi, H.
    New search for: Satake, T.
    New search for: Kaneko, K.
    New search for: Nagai, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    Contributors:

    Hayashi, H. (author) / Satake, T. (author) / Kaneko, K. (author) / Nagai, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 70/71 ; 287

    Publication date:

    1993-01-01

    Size:

    287 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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