Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Spectroscopic ellipsometry of SiO2/CdTe nanocomposite thin films prepared by dc magnetron sputtering

    New search for: Bera, S. K.
    New search for: Bhattacharyya, D.
    New search for: Ghosh, R.
    New search for: Paul, G. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Spectroscopic ellipsometry of SiO2/CdTe nanocomposite thin films prepared by dc magnetron sputtering

    New search for: Bera, S. K.
    New search for: Bhattacharyya, D.
    New search for: Ghosh, R.
    New search for: Paul, G. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry of SiO2/CdTe nanocomposite thin films prepared by dc magnetron sputtering

    New search for: Bera, S. K.
    New search for: Bhattacharyya, D.
    New search for: Ghosh, R.
    New search for: Paul, G. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Spectroscopic ellipsometry of SiO2/CdTe nanocomposite thin films prepared by dc magnetron sputtering

    Contributors:

    Bera, S. K. (author) / Bhattacharyya, D. (author) / Ghosh, R. (author) / Paul, G. K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 6634-6640

    Publication date:

    2009-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Spectroscopic ellipsometry characterization of ZrO2 thin films by nitrogen-assisted reactive magnetron sputtering

    Zhu, L. Q. / Fang, Q. / He, G. et al. | British Library Online Contents | 2006

    Fractal features of CdTe thin films grown by RF magnetron sputtering

    Hosseinpanahi, F. / Raoufi, D. / Ranjbarghanei, K. et al. | British Library Online Contents | 2015

    LaB~x thin films prepared by magnetron sputtering

    Kinbara, A. / Nakano, T. / Kobayashi, A. et al. | British Library Online Contents | 1993

    LaB~x thin films prepared by magnetron sputtering

    Kinbara, A. / Nakano, T. / Kobayashi, A. et al. | British Library Online Contents | 1993

    Photoelectron-spectroscopic and reactivity investigation of thin Pd-Sn films prepared by magnetron sputtering

    Skala, T. / Veltruska, K. / Sedlacek, L. et al. | British Library Online Contents | 2007

    Back to top