Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth: Fid-Bau Portal

Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth

Wohlschlogel, M. / Welzel, U. / Mittemeijer, E.J.

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Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth

Wohlschlogel, M. / Welzel, U. / Mittemeijer, E.J.

Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth

Wohlschlogel, M. / Welzel, U. / Mittemeijer, E.J.

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Document information

Title:

Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth

Contributors:

Wohlschlogel, M. (author) / Welzel, U. (author) / Mittemeijer, E.J. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 1342-1352

Publication date:

2009-01-01

Size:

11 pages

ISSN:

0884-2914

Type of media:

Article (Journal)