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Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth
Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth
Residual stress and strain-free lattice-parameter depth profiles in a gamma '-Fe~4N~1~-~x layer on an alpha -Fe substrate measured by x-ray diffraction stress analysis at constant information depth
Wohlschlogel, M. (Autor:in) / Welzel, U. (Autor:in) / Mittemeijer, E.J. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 1342-1352
01.01.2009
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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