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Inverted Pyramid Defects in 4H-SiC Epilayers

Shrivastava, A. / Muzykov, P.G. / Sudarshan, T.S.

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Inverted Pyramid Defects in 4H-SiC Epilayers

Shrivastava, A. / Muzykov, P.G. / Sudarshan, T.S.

Inverted Pyramid Defects in 4H-SiC Epilayers

Shrivastava, A. / Muzykov, P.G. / Sudarshan, T.S.

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Order at Subito €

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Document information

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Document information

Title:

Inverted Pyramid Defects in 4H-SiC Epilayers

Contributors:

Shrivastava, A. (author) / Muzykov, P.G. (author) / Sudarshan, T.S. (author)

Published in:

MATERIALS SCIENCE FORUM ; 615/617 ; 125-128

Publication date:

2009-01-01

Size:

4 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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