A platform for research: civil engineering, architecture and urbanism
Dislocation-Induced Birefringence in Silicon Carbide
Dislocation-Induced Birefringence in Silicon Carbide
Dislocation-Induced Birefringence in Silicon Carbide
Ouisse, T. (author) / Chaussende, D. (author) / Auvray, L. (author) / Pernot, E. (author) / Madar, R. (author)
MATERIALS SCIENCE FORUM ; 615/617 ; 271-274
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Optical anisotropy and strain-induced birefringence in dislocation-free silicon single crystals
British Library Online Contents | 2002
|X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide
British Library Online Contents | 2001
|Dislocation controlled wear in single crystal silicon carbide
British Library Online Contents | 2013
|A method to determine superscrew dislocation structure in silicon carbide
British Library Online Contents | 2006
|Dislocation-Induced Defect Levels in Silicon
British Library Online Contents | 1993
|