X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide: Fid-Bau Portal

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Pernot, E. / Mermoux, M. / Kreisel, J. / Chaix-Pluchery, O. / Pernot-Rejmankova, P. / Anikin, M. / Pelissier, B. / Glazer, A. M. / Madar, R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Pernot, E. / Mermoux, M. / Kreisel, J. / Chaix-Pluchery, O. / Pernot-Rejmankova, P. / Anikin, M. / Pelissier, B. / Glazer, A. M. / Madar, R.

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Pernot, E. / Mermoux, M. / Kreisel, J. / Chaix-Pluchery, O. / Pernot-Rejmankova, P. / Anikin, M. / Pelissier, B. / Glazer, A. M. / Madar, R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Contributors:

Pernot, E. (author) / Mermoux, M. (author) / Kreisel, J. (author) / Chaix-Pluchery, O. (author) / Pernot-Rejmankova, P. (author) / Anikin, M. (author) / Pelissier, B. (author) / Glazer, A. M. (author) / Madar, R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 353/356 ; 283-286

Publication date:

2001-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Ouisse, T. / Chaussende, D. / Auvray, L. et al. | British Library Online Contents | 2009

Manufacturing method of silicon carbide micro-reaction assembly and silicon carbide micro-reaction assembly

YAN YONGJIE / YAO YUXI | European Patent Office | 2021

Free access

Characterization of Silicon Carbide using Raman Spectroscopy

Burton, J. C. / Long, F. H. / Khlebnikov, Y. et al. | British Library Online Contents | 2000

Study of Indentation Damage in Single Crystal Silicon Carbide by Using Micro Raman Spectroscopy

Yamaguchi, M. / Fujitsuka, M. / Ueno, S. et al. | British Library Online Contents | 2010

Modification method for surface silanization of silicon carbide micro-powder and modified silicon carbide micro-powder

ZHANG GE / GUO CONGHUI / ZHANG WEI et al. | European Patent Office | 2020

Free access