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A platform for research: civil engineering, architecture and urbanism
Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
Ishikawa, Y. (author) / Nagayama, H. (author) / Hoshino, H. (author) / Ohgai, M. (author) / Shibata, N. (author) / Yamamoto, T. (author) / Ikuhara, Y. (author)
MATERIALS TRANSACTIONS ; 50 ; 959-963
2009-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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