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Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
Transmission Electron Microscopy Study of Sn-Doped Sintered Indium Oxide
Ishikawa, Y. (Autor:in) / Nagayama, H. (Autor:in) / Hoshino, H. (Autor:in) / Ohgai, M. (Autor:in) / Shibata, N. (Autor:in) / Yamamoto, T. (Autor:in) / Ikuhara, Y. (Autor:in)
MATERIALS TRANSACTIONS ; 50 ; 959-963
01.01.2009
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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