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    Optical and Structural Characterization of InGaN/GaN Multiple Quantum Wells by Epitaxial Lateral Overgrowth

    New search for: Sugiyama, M.
    New search for: Shioda, T.
    New search for: Tomita, Y.
    New search for: Yamamoto, T.
    New search for: Ikuhara, Y.
    New search for: Nakano, Y.

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    Optical and Structural Characterization of InGaN/GaN Multiple Quantum Wells by Epitaxial Lateral Overgrowth

    New search for: Sugiyama, M.
    New search for: Shioda, T.
    New search for: Tomita, Y.
    New search for: Yamamoto, T.
    New search for: Ikuhara, Y.
    New search for: Nakano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical and Structural Characterization of InGaN/GaN Multiple Quantum Wells by Epitaxial Lateral Overgrowth

    New search for: Sugiyama, M.
    New search for: Shioda, T.
    New search for: Tomita, Y.
    New search for: Yamamoto, T.
    New search for: Ikuhara, Y.
    New search for: Nakano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Optical and Structural Characterization of InGaN/GaN Multiple Quantum Wells by Epitaxial Lateral Overgrowth

    Contributors:

    Sugiyama, M. (author) / Shioda, T. (author) / Tomita, Y. (author) / Yamamoto, T. (author) / Ikuhara, Y. (author) / Nakano, Y. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 50 ; 1085-1090

    Publication date:

    2009-01-01

    Size:

    6 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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