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Atomistic simulation on size-dependent yield strength and defects evolution of metal nanowires

Yang, Z. / Lu, Z. / Zhao, Y. P.

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Atomistic simulation on size-dependent yield strength and defects evolution of metal nanowires

Yang, Z. / Lu, Z. / Zhao, Y. P.

Atomistic simulation on size-dependent yield strength and defects evolution of metal nanowires

Yang, Z. / Lu, Z. / Zhao, Y. P.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Atomistic simulation on size-dependent yield strength and defects evolution of metal nanowires

Contributors:

Yang, Z. (author) / Lu, Z. (author) / Zhao, Y. P. (author)

Published in:

COMPUTATIONAL MATERIALS SCIENCE ; 46 ; 142-150

Publication date:

2009-01-01

Size:

9 pages

ISSN:

0927-0256

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1 / 510

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