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    High-Temperature Thermoelectric Measurement of B-Doped SiGe and Si Thin Films

    New search for: Shin, W.
    New search for: Ishikawa, M.
    New search for: Nishibori, M.
    New search for: Izu, N.
    New search for: Itoh, T.
    New search for: Matsubara, I.

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    High-Temperature Thermoelectric Measurement of B-Doped SiGe and Si Thin Films

    New search for: Shin, W.
    New search for: Ishikawa, M.
    New search for: Nishibori, M.
    New search for: Izu, N.
    New search for: Itoh, T.
    New search for: Matsubara, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-Temperature Thermoelectric Measurement of B-Doped SiGe and Si Thin Films

    New search for: Shin, W.
    New search for: Ishikawa, M.
    New search for: Nishibori, M.
    New search for: Izu, N.
    New search for: Itoh, T.
    New search for: Matsubara, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    High-Temperature Thermoelectric Measurement of B-Doped SiGe and Si Thin Films

    Contributors:

    Shin, W. (author) / Ishikawa, M. (author) / Nishibori, M. (author) / Izu, N. (author) / Itoh, T. (author) / Matsubara, I. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 50 ; 1596-1602

    Publication date:

    2009-01-01

    Size:

    7 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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