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    Towards chemical state resolution in regularized depth profiles derived from ARXPS data taken on plasma-oxidized polystyrene

    New search for: Paynter, R. W.

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    Towards chemical state resolution in regularized depth profiles derived from ARXPS data taken on plasma-oxidized polystyrene

    New search for: Paynter, R. W.

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    Access via TIB
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    Towards chemical state resolution in regularized depth profiles derived from ARXPS data taken on plasma-oxidized polystyrene

    New search for: Paynter, R. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Towards chemical state resolution in regularized depth profiles derived from ARXPS data taken on plasma-oxidized polystyrene

    Contributors:

    Paynter, R. W. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 8738-8742

    Publication date:

    2009-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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