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Measuring the elastic modulus and residual stress of freestanding thin films using nanoindentation techniques

Herbert, E.G. / Oliver, W.C. / de Boer, M.P. / Pharr, G.M.

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Measuring the elastic modulus and residual stress of freestanding thin films using nanoindentation techniques

Herbert, E.G. / Oliver, W.C. / de Boer, M.P. / Pharr, G.M.

Measuring the elastic modulus and residual stress of freestanding thin films using nanoindentation techniques

Herbert, E.G. / Oliver, W.C. / de Boer, M.P. / Pharr, G.M.

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Check availability in my library

Order at Subito €

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Document information

Title:

Measuring the elastic modulus and residual stress of freestanding thin films using nanoindentation techniques

Contributors:

Herbert, E.G. (author) / Oliver, W.C. (author) / de Boer, M.P. (author) / Pharr, G.M. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 2974-2985

Publication date:

2009-01-01

Size:

12 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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