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High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si
High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si
High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si
Wang, Z. (author) / Jeurgens, L.P.H. (author) / Wang, J.Y. (author) / Phillipp, F. (author) / Mittemeijer, E.J. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 3294-3299
2009-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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