High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si: Fid-Bau Portal

High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si

Wang, Z. / Jeurgens, L.P.H. / Wang, J.Y. / Phillipp, F. / Mittemeijer, E.J.

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High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si

Wang, Z. / Jeurgens, L.P.H. / Wang, J.Y. / Phillipp, F. / Mittemeijer, E.J.

High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si

Wang, Z. / Jeurgens, L.P.H. / Wang, J.Y. / Phillipp, F. / Mittemeijer, E.J.

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Document information

Title:

High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si

Contributors:

Wang, Z. (author) / Jeurgens, L.P.H. (author) / Wang, J.Y. (author) / Phillipp, F. (author) / Mittemeijer, E.J. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 3294-3299

Publication date:

2009-01-01

Size:

6 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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