Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5keV krypton ions: Fid-Bau Portal

Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5keV krypton ions

Kaddouri, A. / Ashraf, I. / Fqih, M. A. / Targaoui, H. / Boujlaidi, A. E. / Berrada, K.

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Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5keV krypton ions

Kaddouri, A. / Ashraf, I. / Fqih, M. A. / Targaoui, H. / Boujlaidi, A. E. / Berrada, K.

Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5keV krypton ions

Kaddouri, A. / Ashraf, I. / Fqih, M. A. / Targaoui, H. / Boujlaidi, A. E. / Berrada, K.

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Document information

Title:

Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5keV krypton ions

Contributors:

Kaddouri, A. (author) / Ashraf, I. (author) / Fqih, M. A. (author) / Targaoui, H. (author) / Boujlaidi, A. E. (author) / Berrada, K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 256 ; 116-119

Publication date:

2009-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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