Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction: Fid-Bau Portal

Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

Zolotaryov, A. / Schramm, A. / Heyn, C. / Zozulya, A. / Hansen, W.

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Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

Zolotaryov, A. / Schramm, A. / Heyn, C. / Zozulya, A. / Hansen, W.

Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

Zolotaryov, A. / Schramm, A. / Heyn, C. / Zozulya, A. / Hansen, W.

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Check availability in my library

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Document information

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Document information

Title:

Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

Contributors:

Zolotaryov, A. (author) / Schramm, A. (author) / Heyn, C. (author) / Zozulya, A. (author) / Hansen, W. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 12 ; 75-81

Publication date:

2009-01-01

Size:

7 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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