Imaging elastic property of surfaces at nanoscale using atomic force microscope: Fid-Bau Portal

Imaging elastic property of surfaces at nanoscale using atomic force microscope

Banerjee, S. / Gayathri, N. / Dash, S. / Tyagi, A. K. / Raj, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Imaging elastic property of surfaces at nanoscale using atomic force microscope

Banerjee, S. / Gayathri, N. / Dash, S. / Tyagi, A. K. / Raj, B.

Imaging elastic property of surfaces at nanoscale using atomic force microscope

Banerjee, S. / Gayathri, N. / Dash, S. / Tyagi, A. K. / Raj, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Imaging elastic property of surfaces at nanoscale using atomic force microscope

Contributors:

Banerjee, S. (author) / Gayathri, N. (author) / Dash, S. (author) / Tyagi, A. K. (author) / Raj, B. (author)

Published in:

APPLIED SURFACE SCIENCE ; 256 ; 503-507

Publication date:

2009-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Prime, D. / Paul, S. / Pearson, C. et al. | British Library Online Contents | 2005

Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Lanza, M. / Bayerl, A. / Gao, T. et al. | British Library Online Contents | 2013

Scanning Tunneling Microscope - Atomic Force Microscope

Masuda, H. | British Library Online Contents | 1993

Nanoscale ultrasonic subsurface imaging with atomic force microscopy

Ma, Chengfu / Arnold, Walter | DataCite | 2020

Controlled modification of conducting polymer surfaces by atomic force microscope

Zhou, L. / Zhang, P. C. / Ho, P. K. H. et al. | British Library Online Contents | 1996