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Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Lanza, M. / Bayerl, A. / Gao, T. / Porti, M. / Nafria, M. / Jing, G. Y. / Zhang, Y. F. / Liu, Z. F. / Duan, H. L.

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Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Lanza, M. / Bayerl, A. / Gao, T. / Porti, M. / Nafria, M. / Jing, G. Y. / Zhang, Y. F. / Liu, Z. F. / Duan, H. L.

Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Lanza, M. / Bayerl, A. / Gao, T. / Porti, M. / Nafria, M. / Jing, G. Y. / Zhang, Y. F. / Liu, Z. F. / Duan, H. L.

Access

Access via TIB

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Order at Subito €

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Document information

Title:

Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

Contributors:

Lanza, M. (author) / Bayerl, A. (author) / Gao, T. (author) / Porti, M. (author) / Nafria, M. (author) / Jing, G. Y. (author) / Zhang, Y. F. (author) / Liu, Z. F. (author) / Duan, H. L. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 25 ; 1440-1444

Publication date:

2013-01-01

Size:

5 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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